AI supported inspection Nikon launches new one-click automated microscope

Source: Nikon Metrology Europe 2 min Reading Time

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With the Eclipse LV100AMS, Nikon is targeting faster and more consistent industrial inspection. The automated microscope uses AI-supported image analysis to standardise quality control workflows, including applications such as grain size analysis.

AI-powered Grain Size Analysis automates the evaluation of metallic microstructures, delivering fast, consistent, and operator-independent results. Compliant with ASTM E112 and ISO 643, it ensures reliable, standards-based  grain size measurements for quality control and research applications. (Source:  Nikon Metrology)
AI-powered Grain Size Analysis automates the evaluation of metallic microstructures, delivering fast, consistent, and operator-independent results. Compliant with ASTM E112 and ISO 643, it ensures reliable, standards-based grain size measurements for quality control and research applications.
(Source: Nikon Metrology)

Nikon Corporation (Nikon) has launched the Eclipse LV100AMS, a new one click automated microscope designed to simplify industrial inspection and quality control. Built on Nikon’s established industrial microscope platforms, the LV100AMS combines fully automated inspection with AI powered image analysis, enabling manufacturers to improve consistency, increase inspection speed, and strengthen confidence in inspection outcomes.

Manufacturers today face growing challenges such as labor shortages and increasing throughput demands, making consistent inspection quality difficult to maintain. To address these issues, Nikon developed the LV100AMS, automating the entire inspection workflow from image acquisition to analysis. As John Moore, Sales Director at Nikon, said: “We enable manufacturers to reduce human error, accelerate inspections, and maintain stable quality across production lines.” The LV100AMS is now fully integrated into Nikon’s industrial microscopy portfolio, offering a complete and reliable automated inspection solution.

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With one click execution, even complex inspection routines and advanced image analysis run automatically, eliminating operator to operator variation and reducing human error. This enables repeatable, standardized inspections across shifts and sites, improving yield, lowering rework rates, and reducing training time.

By seamlessly integrating motorized control, automated image acquisition, and AI powered analysis into a single system, the LV100AMS delivers consistent, objective results with minimal operator influence. This increases throughput, supports scalable inspection strategies, and provides higher confidence in quality decisions.

The LV100AMS allows manufacturers to design customer specific inspection workflows tailored to their products, processes, and inspection conditions. This flexibility enables inspection approaches that are not achievable with conventional microscopy, helping manufacturers adapt quickly to new products, design changes, and evolving quality standards.

Nikon Metrology Europe is pleased to invite you to an upcoming webinar introducing the new Eclipse LV100AMS system, with a special focus on one of its key application areas: Grain Size Analysis. During this session, Merten Kuna, Application Engineer, Microscopy Business Unit Europe, will showcase the new one‑click automated microscope and demonstrate its fully automated inspection capabilities. Powered by advanced AI‑driven image analysis, the system enables manufacturers to enhance consistency, increase inspection speed, and gain greater confidence in their inspection results.

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