Metrology Measurement system now with even higher accuracy

Source: Press release

Keyence has further extended its portfolio of precision measurement technologies with a new, high-accuracy image dimension measurement system.

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Featuring an accuracy to ±0.7μm, the LM Series combines the ease of use associated with the Keyence range with the breakthrough precision demanded across an ever broader range of applications.
Featuring an accuracy to ±0.7μm, the LM Series combines the ease of use associated with the Keyence range with the breakthrough precision demanded across an ever broader range of applications.
(Source: Keyence)

Featuring accuracy to ±0.7 μm, the LM Series from Keyence combines ease of use with the breakthrough precision demanded across an ever broader range of applications.

Consistent sub-micron accuracy and repeatability is guaranteed through automated focusing and part positioning, making it ideal for applications with very tight tolerances in sectors from medical and electronics to high-precision metal manufacturing.

The LM Series is easy and rapid to program with intuitive on-screen help always available, and it can be operated with just one button. Items do not need to be precisely positioned, while rapid stage movement and a large field of view for a precision measurement system deliver optimum speed as fewer images are needed compared with alternative systems. The auto-focus function ensures accurate focus irrespective of operator experience.

Up to 300 dimensions can be measured at a time, while the LM Series can measure up to 100 individual parts simultaneously. A convenient integral coaxial light offers a broad variety of lighting options to provide optimised stable edge detection, whatever the material of the item being measured. While more typically used in laboratory environments, the system is sufficiently robust to withstand the rigours of the shopfloor environment with its low-vibration stage.

An integral high-magnification lens with Z-focus positioning allows for highly accurate non-contact height and depth measurement for areas as small as 20 × 20 μm. Additionally, plane elements can be created which are independent from the stage and overall part slope, with flatness and interplane angle measurements easily added to programs. Suitable applications are plentiful and range from prototype and first-off part inspection, to in-process sample and part inspection; and pre-shipping and incoming goods inspections.

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