Fakuma 2017 On-The-Fly CT saves time with rotating machine axis

Editor: Briggette Jaya

Quality Control – Among the numerous exhibits at Werth Messtechnik’s booth at Fakuma will be the company’s patent-pending On-The-Fly CT.

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Patent-pending On-The-Fly CT saves time lag.
Patent-pending On-The-Fly CT saves time lag.
(Source: Werth Messtechnik)

According to Werth, this new CT saves time lag, caused by start-stop positioning of the workpiece, by continuously rotating the machine axis.

In conventional start-stop operations, the rotary motion is interrupted to capture each radiographic image, so that no motion blur occurs under continuous exposure. With On-The-Fly CT, short exposure times are needed to minimise motion blur. To ensure measurement uncertainty matches the one in the start-stop operations, the number of rotary increments is thus increased. The specification as per VDI/VDE requirements is nevertheless not affected, despite the greatly accelerated measurement process. This ensures that the traceability of the measurement results with On-The-Fly CT is maintained.

Patent-pending On-The-Fly CT saves time lag, caused by start-stop positioning of the workpiece, in that the machine axis continuously rotates.
Patent-pending On-The-Fly CT saves time lag, caused by start-stop positioning of the workpiece, in that the machine axis continuously rotates.
(Source: Werth Messtechnik)

Furthermore, with the On-The-Fly process, measurement time can be reduced by up to ten times for the same quality of data, the company says. The workpiece volume is reconstructed in real time and is available immediately after measurement. Alternatively, the data quality may be increased for the same measurement time. Methods such as raster and ROI (Region of Interest) tomography or higher-detector resolution produce workpiece volumes of higher resolution with a better signal-to-noise ratio. The increased measurement time traditionally associated with these methods can be avoided with On-The-Fly CT. The new technology opens up other application areas for computed tomography that have strict measurement time requirements for a given data quality.

At Fakuma, Werth will be in Hall A3, Booth 3201.

(ID:44875174)