Control show Non-contact measurements with line sensors
Germany – Precitec Optronik will be presenting new non-contact measurement sensors and optical probes that also detect layer thicknesses, profiles and topographies.
The company says that its systems are particularly suitable for inline use because they can detect moving objects, reliably. The optical probes determine distances or layer thicknesses in the µ-range. High measuring frequencies are used in order to deliver rapid results and fast cycle times. Measuring heads, which are not temperature-sensitive, use visible spectrum and infrared light in combination with confocal chromatic and interferometric measuring principles and are particularly suitable for topographies in the micrometer range. The new line sensor is up to two hundred times faster than a single-point sensor.
Precitec Optronik measurement systems are used across the world for quality assurance in production, especially for plastics, glass and semiconductor/solar wafer industries.