Technology Metrology system uses X-rays to root out hidden problems
A quality control system from Nikon is said to identify all shrinkage, deformation and dimensional errors with easy-to-understand inspection reports so toolmakers can define corrective actions more easily. This cuts the time to market for new products.
The MCT225 HA combines more than 95 years of Nikon experience in optical metrology, 50 years of LK experience in CMM metrology and 25 years of X-Tek experience in computed tomography (CT), according to the supplier. The MCT225 HA – claimed to be the most accurate in its class – is said to provide high accuracy metrology CT for a wide range of sample sizes and material densities with 3.8+ L/50 µm MPEl accuracy in accordance with the VDI/VDE 2630 guideline.
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Is this the future of dimensional inspection?
The supplier noted that all internal and external geometry is measured efficiently in a single non-destructive process. A full 3D visualization of the sample volume additionally provides valuable insights into part deformations and internal structural integrity. According to Nikon, metrology CT, which fuses metrology and X-ray computed tomography (CT), is poised to become the future of dimensional inspection.