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GOM Conference presents latest trends in optical 3D metrology

Editor: Eric Culp

Participants discussed topics with attendees from top OEMs.

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Conference attendees also had a chance to see some of the company’s products in action.
Conference attendees also had a chance to see some of the company’s products in action.
(Source: Marc Stantien)

With more than 600 participants, this year’s conference at GOM proved itself as a well-established platform for meeting experts in measurement technology, quality control and product development, according to the host. Main topics of the event at GOM’s headquarters in Braunschweig, Germany, were automated inspection in production-related quality control as well as material and component testing, the company said.

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“During the lecture program it became clear that optical metrology was first used for design and tool-making applications and is now established in production related quality control,” GOM noted. Implementing automated measuring and inspection solutions lets companies react to increased production levels and their shorter measurement times.

Attendees from Adidas, Miele, Lamborghini, Audi, Bertrandt, Brembo, Tata Steel Europe and Stryker discussed their experience with optical metrology solutions.

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