GOM Conference for industrial 3D metrology, inspection and testing

Editor: Rosemarie Stahl

Metrology – On 26 and 27 September, 2017, the GOM 3D Metrology Conference will show how optical measuring systems shorten development cycles and improve production processes.

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GOM Conference is a forum for executives, metrologists and experts from well-known companies and research institutions.
GOM Conference is a forum for executives, metrologists and experts from well-known companies and research institutions.
(Source: GOM)

Today, optical metrology is a standard in industry and research for quality assurance and materials testing. More than 600 experts from 40 countries are expected at GOM’s headquarters in Braunschweig, Germany, to discuss topics such as automation, virtual assembly analysis, airfoil inspection and materials testing based on optical 3D measuring data, the company says.

The international conference is a forum for executives, metrologists and experts from well-known companies and research institutions who reveal their first-hand experiences. According to the company, GOM presents trends as well as recent developments in sensor technologies and software for the entire production process ranging from materials testing through design and toolmaking up to series inspection.

Alongside a presentation forum, interactive solution tracks and a technical exhibition, GOM provides an insight into the production of industrial 3D metrology in regular guided tours. Joint networking dinners encourage the direct exchange of experiences.

This year, the conference takes place for the 13th time. The event will be held in English.

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